Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	August 2014
Genre:	EDV / Informatik
	Algorithm Analysis and Problem Complexity / Algorithmen und Datenstrukturen / Algorithms / Algorithms & data structures / angewandte informatik / Application software / Artificial Intelligence / Automated Pattern Recognition / C / Computer and Information Systems Applications / computer science / Data Mining / Data Mining and Knowledge Discovery / Database Management / database programming / Databases / Datenbanken / Expert systems / knowledge-based systems / Information Retrieval / Information Systems Applications (incl. Internet) / Internet searching / Mustererkennung / pattern recognition / Wissensbasierte Systeme, Expertensysteme mehr...
ISBN:	9783662444146
EAN-Code:	9783662444146
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Serie:	Image Processing, Computer Vision, Pattern Recognition, and Graphics #8621 - Lecture Notes in Computer Science
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	7489 gr
Seiten:	478
Illustration:	XX, 478 p. 124 illus., schwarz-weiss Illustrationen
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.