Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 14-24 Tagen versandfertig
Veröffentlichung:	April 2006
Genre:	Naturwissensch., Medizin, Technik
	C / Circuits and Systems / Condensed Matter Physics / Electronic circuits / Electronic Circuits and Systems / Electronics / Electronics and Microelectronics, Instrumentation / Electronics engineering / Electronics# circuits & components / Materials science / Materials Science, general / Measurement / Measurement Science and Instrumentation / Microelectronics / Microscopy / Physical measurements / Physics and Astronomy / Scientific equipment, experiments & techniques / Scientific standards, measurement etc / Solid State Physics / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry
ISBN:	9783540319146
EAN-Code:	9783540319146
Verlag:	Springer Berlin Heidelberg
Einband:	Gebunden
Sprache:	English
Serie:	#107 - Springer Proceedings in Physics
Dimensionen:	H 241 mm / B 160 mm / D 35 mm
Gewicht:	992 gr
Seiten:	556
Zus. Info:	HC runder Rücken kaschiert
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.