Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Oktober 2010
Genre:	Naturwissensch., Medizin, Technik
	C / Circuits and Systems / Condensed Matter Physics / Electronic circuits / Electronic Circuits and Systems / Electronics / Electronics and Microelectronics, Instrumentation / Electronics engineering / Electronics# circuits & components / Materials science / Materials Science, general / Measurement / Measurement Science and Instrumentation / Microelectronics / Microscopy / Physical measurements / Physics and Astronomy / Scientific equipment, experiments & techniques / Scientific standards, measurement etc / Solid State Physics / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry
ISBN:	9783642068706
EAN-Code:	9783642068706
Verlag:	Springer Nature EN
Einband:	Kartoniert
Sprache:	English
Serie:	#107 - Springer Proceedings in Physics
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	1442 gr
Seiten:	540
Zus. Info:	Previously published in hardcover
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.