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Herausgeber: 
  • Nien Fan Zhang
  • ALISTAIR B FORBES
  • Sascha Eichstadt
  • Anna G Chunovkina
  • Pavese Franco
  • Advanced Mathematical And Computational Tools In Metrology And Testing Xi 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Dezember 2018  
    Genre:  Schulbücher 
     
    Algorithms, Data Analysis, Metrology, Traceability, Uncertainty Evaluation / Mensuration & Systems Of Measurement / SCIENCE / Weights & Measures / Scientific Standards / Scientific standards, measurement etc
    ISBN:  9789813274297 
    EAN-Code: 
    9789813274297 
    Verlag:  World Scientific Publishing 
    Einband:  Gebunden  
    Sprache:  English  
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September 2017, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and for evaluation of the measurement uncertainty, and describe their applications in a wide range of measurement areas. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.

      



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