Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 7-14 Tagen versandfertig
Veröffentlichung:	März 2020
Genre:	Naturwissensch., Medizin, Technik
	AnalogDesignCenteringandSizing / AnalogICReliabilityinNanometerCMOS / analogintegratedcircuityieldestimation / MonteCarlo-BasedYieldEstimation / Schaltkreise und Komponenten (Bauteile) / Variation-AwareDesignofCustomIntegratedCircuits
ISBN:	9783030415358
EAN-Code:	9783030415358
Verlag:	Springer
Einband:	Gebunden
Sprache:	English
Dimensionen:	H 241 mm / B 160 mm / D 20 mm
Gewicht:	565 gr
Seiten:	264
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.