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Autor(en): 
  • Shih-Lin Chang
  • X-Ray Multiple-Wave Diffraction: Theory and Application 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Dezember 2010  
    Genre:  Naturwissensch., Medizin, Technik 
     
    Accelerator Physics / C / Crystallography / Crystallography and Scattering Methods / Mathematical Methods in Physics / Mathematical physics / Numerical and Computational Physics, Simulation / Particle & high-energy physics / Particle acceleration / Particle Acceleration and Detection, Beam Physics / Physics / Physics and Astronomy / Theoretical, Mathematical and Computational Physics
    ISBN:  9783642059476 
    EAN-Code: 
    9783642059476 
    Verlag:  Springer Nature EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Serie:  #143 - Springer Series in Solid-State Sciences  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  688 gr 
    Seiten:  436 
    Zus. Info:  Previously published in hardcover 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two­ or higher-dimensional structures, like 2-d and 3-d crystals and even quasi­ crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in­ volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X­ ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure­ ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver­ sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.
      
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