Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	August 2016
Genre:	Naturwissensch., Medizin, Technik
	B / Circuits and Systems / Computer architecture & logic design / Electronic circuits / Electronic Circuits and Systems / Electronic devices & materials / Elektronische Geräte und Materialien / engineering / Microprocessors / Processor Architectures / Rechnerarchitektur und Logik-Entwurf / Semiconductors mehr...
ISBN:	9783319330693
EAN-Code:	9783319330693
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	8774 gr
Seiten:	552
Illustration:	XXXIV, 552 p.
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Aimed at electronics industry professionals, this 4th edition of the Boundary Scan Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and Boundary-Scan Architecture. This updated edition features new chapters on the possible effects of the changes on the work of the practicing test engineers and the new 1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect of the changes on the work of test engineers; Explains the new IEEE 1149.8.1 subsidiary standard and applications; Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1                  Digital Boundary-ScanIEEE Std 1149.4                  Analog Boundary-ScanIEEE Std 1149.6                  Advanced I/O TestingIEEE Std 1149.8.1                Passive Component TestingIEEE Std 1149.1-2013             The 2013 Revision of 1149.1IEEE Std 1532                    In-System ConfigurationIEEE Std 1149.6-2015             The 2015 Revision of 1149.6