Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 5-10 Tagen versandfertig
Veröffentlichung:	November 2014
Genre:	Naturwissensch., Medizin, Technik
	B / Circuits and Systems / computer hardware / Computer software—Reusability / Electronic circuits / Electronic Circuits and Systems / engineering / Maintenance & repairs / Microsystems and MEMS / Nanotechnology / Nanotechnology and Microengineering / Other manufacturing technologies / Performance and Reliability / Systems analysis & design
ISBN:	9781489989529
EAN-Code:	9781489989529
Verlag:	Springer New York
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 235 mm / B 155 mm / D 13 mm
Gewicht:	359 gr
Seiten:	232
Zus. Info:	Paperback
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.