|
|
|
Test Pattern Generation using Boolean Proof Engines
|
 (Buch) |
Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!
| Inhalt: |
| In
Test Pattern Generation using Boolean Proof Engines
, we give an introduction to ATPG. The basic concept and classical ATPG algorithms are reviewed. Then, the formulation as a SAT problem is considered. As the underlying engine, modern SAT solvers and their use on circuit related problems are comprehensively discussed. Advanced techniques for SAT-based ATPG are introduced and evaluated in the context of an industrial environment. The chapters of the book cover efficient instance generation, encoding of multiple-valued logic, usage of various fault models, and detailed experiments on multi-million gate designs. The book describes the state of the art in the field, highlights research aspects, and shows directions for future work.
|
|