Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	November 2016
Genre:	EDV / Informatik
	Algorithm Analysis and Problem Complexity / Algorithmen und Datenstrukturen / Algorithms / Algorithms & data structures / angewandte informatik / Application software / Artificial Intelligence / Automated Pattern Recognition / C / Computer and Information Systems Applications / computer science / Data Mining / Data Mining and Knowledge Discovery / Database Management / database programming / Databases / Datenbanken / Expert systems / knowledge-based systems / Information Retrieval / Information Systems Applications (incl. Internet) / Internet searching / Mustererkennung / pattern recognition / structural SV / Wissensbasierte Systeme, Expertensysteme mehr...
ISBN:	9783319490540
EAN-Code:	9783319490540
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Serie:	Image Processing, Computer Vision, Pattern Recognition, and Graphics #10029 - Lecture Notes in Computer Science
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	9007 gr
Seiten:	588
Illustration:	XIII, 588 p. 167 illus., schwarz-weiss Illustrationen
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.