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Autor(en): 
  • Hao Yu
  • Ruijing Shen
  • Sheldon X.-D. Tan
  • Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  April 2014  
    Genre:  Naturwissensch., Medizin, Technik 
     
    B / Circuits and Systems / Computer-Aided Design (CAD) / Computer-aided engineering / Computer-Aided Engineering (CAD, CAE) and Design / Electronic circuits / Electronic Circuits and Systems / engineering
    ISBN:  9781489987877 
    EAN-Code: 
    9781489987877 
    Verlag:  Springer EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  516 gr 
    Seiten:  306 
    Illustration:  XXX, 306 p. 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits.  Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in the context of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.  Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits;Helps chip designers understand the potential and limitations of their design tools, improving their design productivity;Presents analysis of each algorithm with practical applications in thecontext of real circuit design;Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. 
      



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