Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Mai 2013
Genre:	Naturwissensch., Medizin, Technik
	B / Bioanalysis and Bioimaging / Biological Microscopy / Biology, life sciences / Biophysik / Characterization and Analytical Technique / Characterization and Evaluation of Materials / Chemistry and Materials Science / Humanities and Social Sciences / Interdisciplinary studies / Interdisziplinäre Studien / Materials science / Materials Science, general / Materials—Surfaces / Materialwissenschaft / Microscopy / Nanotechnologie / Nanotechnology / Science, Humanities and Social Sciences, multidisciplinary / Scientific equipment, experiments & techniques / Surface chemistry & adsorption / Surfaces and Interfaces, Thin Films / Surfaces, Interfaces and Thin Film / Thin films mehr...
ISBN:	9781461349693
EAN-Code:	9781461349693
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 254 mm / B 178 mm / D 43 mm
Gewicht:	1348 gr
Seiten:	689
Illustration:	XIX, 689 p.
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities across the globe. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens.