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Scan Chain: Flip-Flop (Electronics), Integrated Circuit, Clock Signal, Shift Register
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(Buch) |
Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 2 Artikel!
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| Please note that the content of this book primarily consists of articles
available from Wikipedia or other free sources online. Scan chain is a
technique used in Design For Test. The objective is to make testing
easier by providing a simple way to set and observe every flip-flop in
an IC. A special signal called scan enable is added to a design. When
this signal is asserted, every flip-flop in the design is connected into
a long shift register, one input pin provides the data to this chain,
and one output pin is connected to the output of the chain. Then using
the chip's clock signal, an arbitrary pattern can be entered into the
chain of flips flops, and/or the state of every flip flop can be read
out. |
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i.d.R. innert 7-14 Tagen versandfertig
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