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Autor(en): 
  • James E. Morris
  • Cristina Andersson
  • Johan Liu
  • Olli Salmela
  • Jussi Sarkka
  • Per-Erik Tegehall
  • Reliability of Microtechnology: Interconnects, Devices and Systems 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Oktober 2014  
    Genre:  Naturwissensch., Medizin, Technik 
     
    B / Electronic devices & materials / Electronic materials / Electronics / Electronics and Microelectronics, Instrumentation / engineering / Industrial and Production Engineering / Industrial safety / Microelectronics / Microsystems and MEMS / Nanotechnology / Nanotechnology and Microengineering / Optical and Electronic Materials / Optical Materials / Other manufacturing technologies / quality control / Quality Control, Reliability, Safety and Risk / reliability / Reliability engineering
    ISBN:  9781489982117 
    EAN-Code: 
    9781489982117 
    Verlag:  Springer Nature EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  343 gr 
    Seiten:  204 
    Illustration:  XIII, 204 p. 
    Zus. Info:  Previously published in hardcover 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail. The book also:

    • Discusses the general failure mechanisms of microsystems on a component level
    • Offers comprehensive coverage of solder joint reliability at the microsystems level
    • Analyzes?quality issues and manufacturing at the microsystems level

    Reliability of Microtechnology is an ideal volume for researchers and professional engineers working in reliability and manufacturing. The book also includes exercises and detailed solutions at the end of each chapter.

      
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