Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 7-14 Tagen versandfertig
Veröffentlichung:	Dezember 2004
Genre:	Naturwissensch., Medizin, Technik
	Electronic devices and materials / SCIENCE / Chemistry / Physical & Theoretical / Semi-conductors & super-conductors / Surface chemistry & adsorption / Surface chemistry and adsorption / TECHNOLOGY & ENGINEERING / Materials Science / General / Testing of materials
ISBN:	9780521453738
EAN-Code:	9780521453738
Verlag:	Cambridge Academic
Einband:	Gebunden
Sprache:	English
Dimensionen:	H 244 mm / B 170 mm / D 21 mm
Gewicht:	894 gr
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.