Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 7-14 Tagen versandfertig
Veröffentlichung:	Februar 2011
Genre:	Naturwissensch., Medizin, Technik
	Electronic devices and materials / Surface chemistry & adsorption / Surface chemistry and adsorption / Surface-coating technology / TECHNOLOGY & ENGINEERING / Materials Science / General / Testing of materials
ISBN:	9780521184021
EAN-Code:	9780521184021
Verlag:	Cambridge Academic
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 244 mm / B 170 mm / D 19 mm
Gewicht:	600 gr
Illustration:	Worked examples or Exercises
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth.