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Process Variation (Semiconductor): Integrated Circuit, Analog Circuit, William Shockley, MOSFET
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Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 2 Artikel!
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| High Quality Content by WIKIPEDIA articles! Process variation is the
naturally occurring variation the attributes of transistors (length,
widths, oxide thickness) when integrated circuits are fabricated. It
becomes particularly important at smaller process nodes (<65 nm) as
the variation becomes a larger percentage of the full length or width of
the device and as feature sizes approach the fundamental dimensions such
as the size of atoms and the wavelength of usable light for patterning
lithography masks. Process variation causes measurable and predictable
variance in the output performance of all circuits but particularly
analog circuits due to mismatch. If the variance causes the measured or
simulated performance of a particular output metric (bandwidth, gain,
rise time, etc) to fall below or rise above the specification for the
particular circuit or device it reduces the overall yield for that set
of devices. |
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