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Lieferstatus:	i.d.R. innert 7-14 Tagen versandfertig
Veröffentlichung:	Dezember 2018
Genre:	Naturwissensch., Medizin, Technik
	B / Characterization and Analytical Technique / Characterization and Evaluation of Materials / Electronic devices & materials / Electronic materials / Interfaces (Physical sciences) / Materials science / Materials—Surfaces / Microscopy / Optical and Electronic Materials / Optical Materials / Physics and Astronomy / Scientific equipment, experiments & techniques / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry / Surface and Interface and Thin Film / Surface and Interface Science, Thin Films / Surface chemistry & adsorption / Surfaces (Physics) / Surfaces and Interfaces, Thin Films / Surfaces, Interfaces and Thin Film / Testing of materials / Thin films
ISBN:	9783030092009
EAN-Code:	9783030092009
Verlag:	Springer International Publishing
Einband:	Kartoniert
Sprache:	English
Serie:	#64 - Springer Series in Surface Sciences
Dimensionen:	H 235 mm / B 155 mm / D 27 mm
Gewicht:	733 gr
Seiten:	488
Zus. Info:	Paperback
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.