Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 14-24 Tagen versandfertig
Veröffentlichung:	Mai 1997
Genre:	Naturwissensch., Medizin, Technik
	TECHNOLOGY & ENGINEERING / Electrical / TECHNOLOGY & ENGINEERING / Electronics / Circuits / General
ISBN:	9780792399209
EAN-Code:	9780792399209
Verlag:	Springer Nature B.V.
Einband:	Gebunden
Sprache:	English
Dimensionen:	H 260 mm / B 183 mm / D 14 mm
Gewicht:	525 gr
Seiten:	168
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).