Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	August 2016
Genre:	Naturwissensch., Medizin, Technik
	B / Interfaces (Physical sciences) / Materials science / Materials—Surfaces / Measurement / Measurement Science and Instrumentation / Microscopy / Physical measurements / Physics and Astronomy / Scientific equipment, experiments & techniques / Scientific standards, measurement etc / spectroscopy / Spectroscopy and Microscopy / Spectroscopy/Spectrometry / Spectrum analysis, spectrochemistry, mass spectrometry / Surface and Interface and Thin Film / Surface and Interface Science, Thin Films / Surface chemistry & adsorption / Surfaces (Physics) / Surfaces and Interfaces, Thin Films / Surfaces, Interfaces and Thin Film / Thin films mehr...
ISBN:	9783319353029
EAN-Code:	9783319353029
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Serie:	#55 - Springer Series in Surface Sciences
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	5679 gr
Seiten:	356
Illustration:	XVIII, 356 p. 254 illus., 107 illus. in color., farbige Illustrationen, schwarz-weiss Illustrationen
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.