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Autor(en): 
  • S. Chakravarty
  • Paul J. Thadikaran
  • Introduction to IDDQ Testing 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   i.d.R. innert 7-14 Tagen versandfertig
    Veröffentlichung:  Oktober 2012  
    Genre:  Naturwissensch., Medizin, Technik 
     
    C / Computer-Aided Design (CAD) / Computer-aided engineering / Computer-Aided Engineering (CAD, CAE) and Design / Electrical and Electronic Engineering / Electrical Engineering / engineering / microsystems
    ISBN:  9781461378129 
    EAN-Code: 
    9781461378129 
    Verlag:  Springer EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Serie:  #08 - Frontiers in Electronic Testing  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  534 gr 
    Seiten:  323 
    Illustration:  XIX, 323 p. 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    Testing techniques for VLSI circuits are undergoing many exciting changes. The predominant method for testing digital circuits consists of applying a set of input stimuli to the IC and monitoring the logic levels at primary outputs. If, for one or more inputs, there is a discrepancy between the observed output and the expected output then the IC is declared to be defective. A new approach to testing digital circuits, which has come to be known as IDDQ testing, has been actively researched for the last fifteen years. In IDDQ testing, the steady state supply current, rather than the logic levels at the primary outputs, is monitored. Years of research suggests that IDDQ testing can significantly improve the quality and reliability of fabricated circuits. This has prompted many semiconductor manufacturers to adopt this testing technique, among them Philips Semiconductors, Ford Microelectronics, Intel, Texas Instruments, LSI Logic, Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers. Introduction to IDDQ Testing is designed to educate this community. The authors have summarized in one volume the main findings of more than fifteen years of research in this area.

      
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