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Autor(en): 
  • Thorsten Wuest
  • Identifying Product and Process State Drivers in Manufacturing Systems Using Supervised Machine Learning 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Mai 2015  
    Genre:  Naturwissensch., Medizin, Technik 
     
    Artificial Intelligence / B / Computational Intelligence / Computer-Aided Design (CAD) / Computer-aided engineering / Computer-Aided Engineering (CAD, CAE) and Design / engineering / Industrial and Production Engineering
    ISBN:  9783319176109 
    EAN-Code: 
    9783319176109 
    Verlag:  Springer EN 
    Einband:  Gebunden  
    Sprache:  English  
    Serie:  Springer Theses  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  720 gr 
    Seiten:  272 
    Illustration:  XVIII, 272 p. 139 illus., 10 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    The book reports on a novel approach for holistically identifying the relevant state drivers of complex, multi-stage manufacturing systems. This approach is able to utilize complex, diverse and high-dimensional data sets, which often occur in manufacturing applications, and to integrate the important process intra- and interrelations. The approach has been evaluated using three scenarios from different manufacturing domains (aviation, chemical and semiconductor). The results, which are reported in detail in this book, confirmed that it is possible to incorporate implicit process intra- and interrelations on both a process and programme level by applying SVM-based feature ranking. In practice, this method can be used to identify the most important process parameters and state characteristics, the so-called state drivers, of a manufacturing system. Given the increasing availability of data and information, this selection support can be directly utilized in, e.g., quality monitoring and advanced process control. Importantly, the method is neither limited to specific products, manufacturing processes or systems, nor by specific quality concepts.

      



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