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Herausgeber: 
  • Matthias von Davier
  • Young-Sun Lee
  • Handbook of Diagnostic Classification Models: Models and Model Extensions, Applications, Software Packages 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Oktober 2019  
    Genre:  Psychologie / Pädagogik 
     
    assessment / Assessment and Testing / Assessment, Testing and Evaluation / B / Cognition & cognitive psychology / cognitive psychology / Dimensionality / Education
    ISBN:  9783030055837 
    EAN-Code: 
    9783030055837 
    Verlag:  Springer EN 
    Einband:  Gebunden  
    Sprache:  English  
    Serie:  Methodology of Educational Measurement and Assessment  
    Dimensionen:  H 235 mm / B 155 mm / D 41 mm 
    Gewicht:  1166 gr 
    Seiten:  656 
    Illustration:  XIV, 656 p. 91 illus., 17 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    This handbook provides an overview of major developments around diagnostic classification models (DCMs) with regard to modeling, estimation, model checking, scoring, and applications. It brings together not only the current state of the art, but also the theoretical background and models developed for diagnostic classification. The handbook also offers applications and special topics and practical guidelines how to plan and conduct research studies with the help of DCMs.

    Commonly used models in educational measurement and psychometrics typically assume a single latent trait or at best a small number of latent variables that are aimed at describing individual differences in observed behavior. While this allows simple rankings of test takers along one or a few dimensions, it does not provide a detailed picture of strengths and weaknesses when assessing complex cognitive skills.

    DCMs, on the other hand, allow the evaluation of test taker performance relative to a potentially large number of skill domains. Most diagnostic models provide a binary mastery/non-mastery classification for each of the assumed test taker attributes representing these skill domains. Attribute profiles can be used for formative decisions as well as for summative purposes, for example in a multiple cut-off procedure that requires mastery on at least a certain subset of skills.

    The number of DCMs discussed in the literature and applied to a variety of assessment data has been increasing over the past decades, and their appeal to researchers and practitioners alike continues to grow. These models have been used in English language assessment, international large scale assessments, and for feedback for practice exams in preparation of college admission testing, just to name a few.

    Nowadays, technology-based assessments provide increasingly rich data on a multitude of skills and allow collection of data with respect to multiple types of behaviors. Diagnostic models can be understood as an ideal match for these types of data collections to provide more in-depth information about test taker skills and behavioral tendencies.


      



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