Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Juli 2018
Genre:	Naturwissensch., Medizin, Technik
	B / Circuits and Systems / Computer architecture & logic design / Electronic circuits / Electronic Circuits and Devices / Electronic Circuits and Systems / Electronic devices & materials / Electronics# circuits & components / engineering / Microprocessors / Processor Architectures mehr...
ISBN:	9783319840413
EAN-Code:	9783319840413
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	226 gr
Seiten:	118
Illustration:	XX, 118 p. 72 illus., 69 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.