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Development and characterization of thin nickel oxide films
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Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 2 Artikel!
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| Tremendous progress has been made in the field of materials science; Many technological challenges still remain, including the development of new materials and consideration of the social and environmental impact of their production and use. In this work, the development of thin layers and their characterization are presented using accessible and clear terminology. The development and characterization methods are explained in detail. An example of a thin layer of undoped and cobalt-doped nickel oxide is presented; the structural, optical and electrical properties are determined. This book is intended for students and post-graduation researchers. |
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i.d.R. innert 7-14 Tagen versandfertig
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