Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	November 2010
Genre:	Naturwissensch., Medizin, Technik
	C / Circuits and Systems / Electrical and Electronic Engineering / Electrical Engineering / Electronic circuits / Electronic Circuits and Systems / Electronics / Electronics and Microelectronics, Instrumentation / Electronics engineering / Elektronik / Elektrotechnik / engineering / Engineering Design / Konstruktion, Entwurf / Microelectronics / Technical design mehr...
ISBN:	9781441942852
EAN-Code:	9781441942852
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Serie:	#34 - Frontiers in Electronic Testing
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	539 gr
Seiten:	328
Illustration:	XXI, 328 p.
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book is essential to understand new test methodologies, algorithms and industrial practices. Without its insight into the physics of nano-metric technologies, it would be difficult to develop system-level test strategies that yield a high IC fault coverage. The work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. The 2nd edition of Defect Oriented Testing has been extensively updated with the addition of chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering to provide a link between defect sources and yield. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.