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Herausgeber: 
  • Franco Pavese
  • Alistair B. Forbes
  • Data Modeling for Metrology and Testing in Measurement Science 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  Dezember 2008  
    Genre:  Schulbücher 
     
    B / Computational Mathematics and Numerical Analysis / Computer mathematics / Fertigungstechnik und Ingenieurwesen / Industrial and Production Engineering / Industrial Engineering / Mathematical & statistical software / Mathematical Modeling and Industrial Mathematics
    ISBN:  9780817645922 
    EAN-Code: 
    9780817645922 
    Verlag:  Springer EN 
    Einband:  Gebunden  
    Sprache:  English  
    Serie:  Modeling and Simulation in Science, Engineering and Technology  
    Dimensionen:  H 235 mm / B 155 mm / D 33 mm 
    Gewicht:  928 gr 
    Seiten:  486 
    Illustration:  XVIII, 486 p. 111 illus., schwarz-weiss Illustrationen 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    This book and companion DVD provide a comprehensive set of modeling methods for data and uncertainty analysis, taking readers beyond mainstream methods described in standard texts. The emphasis throughout is on techniques having a broad range of real-world applications in measurement science.
    Mainstream methods of data modeling and analysis typically rely on certain assumptions that do not hold for many practical applications. Developed in this work are methods and computational tools to address general models that arise in practice, allowing for a more valid treatment of calibration and test data and providing a deeper understanding of complex situations in measurement science.
    Additional features and topics of the book include:
    * Introduction to modeling principles in metrology and testing
    * Presentation of a basic probability framework in metrology and statistical approaches to uncertainty assessment
    * Discussion of the latest developments in data analysis using least squares, Fast Fourier Transform, wavelets, and fuzzy logic methods
    * Data fusion using neural networks, fuzzy methods, decision making, and risk analysis
    * A computer-assisted, rigorous approach to data evaluation and analysis of measurement software validity
    * Introduction to virtual instruments, and an overview of IT tools for measurement science
    Data Modeling for Metrology and Testing in Measurement Science may be used as a textbook in graduate courses on data modeling and computational methods, or as a training manual in the fields of calibration and testing. The book will also serve as an excellent reference for metrologists, mathematicians, statisticians, software engineers, chemists, and other practitioners with a general interest in measurement science.

      



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