Critical topics that make Complex System Reliability a unique and definitive resource include:
. redundant system analysis for k-out-of-n systems (including complex systems with embedded k-out-of-n structures) involving both perfect and imperfect fault coverage;
. imperfect fault coverage analysis techniques, including algorithms for assessing the reliability of redundant systems in which each element is subject to a given coverage value (element level coverage) or in which the system uses voting to avoid the effects of a failed element (fault level coverage); and
. state-of-the-art binary decision diagram analysis techniques, including the latest and most efficient algorithms for the reliability assessment of large, complex redundant systems.

This practical presentation includes numerous fully worked examples that provide detailed explanations of both the underlying design principles and the techniques (such as combinatorial, recursive and binary decision diagram algorithms) used to obtain quantitative results. Many of the worked examples are based on the design of modern digital fly-by-wire control system technology.

Complex System Reliability provides in-depth coverage of systems subject to either perfect or imperfect fault coverage and also the most recent techniques for correctly assessing the reliability of redundant systems that use mid-value-select voting as their primary means of redundancy management. It is a valuable resource for those involved in the design and reliability assessment of highly reliable systems, particularly in the aerospace and automotive sectors.

Springer Series in Reliability Engineering publishes high-quality books in important areas of current theoretical research and development in reliability, and in areas that bridge the gap between theory and application in areas of interest to practitioners in industry, laboratories, business, and government.