Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	November 2011
Genre:	Naturwissensch., Medizin, Technik
	Analyse u. Charakterisierung von Nanosystemen / Analysis/Characterization of Nanosystems / Atomlagenabscheidung / Dünne Schicht / Dünne Schichten, Oberflächen u. Grenzflächen / Electrical & Electronics Engineering / Electronic materials / Elektronische Materialien / Elektrotechnik u. Elektronik / Materials science / Materialwissenschaften / Nanomaterial / Nanomaterialien / Nanomaterials / Nanostrukturiertes Material / Nanotechnologie / Nanotechnology / Sensor Materials / Sensoren / Synthese u. Produktion von Nanosystemen / Synthesis/Production of Nanosystems / Thin Films, Surfaces & Interfaces
ISBN:	9783527327973
EAN-Code:	9783527327973
Verlag:	Wiley-Vch
Einband:	Gebunden
Sprache:	English
Dimensionen:	H 240 mm / B 170 mm / D 28 mm
Gewicht:	974 gr
Seiten:	472
Illustration:	farbige Illustrationen, Tabellen, schwarz-weiss, schwarz-weiss Illustrationen
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Atomic layer deposition, formerly called atomic layer epitaxy, was developed in the 1970s to meet the needs of producing high-quality, large-area fl at displays with perfect structure and process controllability. Nowadays, creating nanomaterials and producing nanostructures with structural perfection is an important goal for many applications in nanotechnology. As ALD is one of the important techniques which offers good control over the surface structures created, it is more and more in the focus of scientists. The book is structured in such a way to fi t both the need of the expert reader (due to the systematic presentation of the results at the forefront of the technique and their applications) and the ones of students and newcomers to the fi eld (through the first part detailing the basic aspects of the technique). This book is a must-have for all Materials Scientists, Surface Chemists, Physicists, and Scientists in the Semiconductor Industry.