Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	November 2008
Genre:	Naturwissensch., Medizin, Technik
	AFM;REM;ceramics;microscopy;polymer;spectroscopy;ultrasound / C / Chemistry and Materials Science / Interfaces (Physical sciences) / Materials science / Materials—Surfaces / Microscopy / Microsystems and MEMS / Nanotechnology / Nanotechnology and Microengineering / Polymer chemistry / Polymer Sciences / polymers / Scientific equipment, experiments & techniques / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry / Surface and Interface and Thin Film / Surface and Interface Science, Thin Films / Surface chemistry & adsorption / Surfaces (Physics) / Surfaces and Interfaces, Thin Films / Surfaces, Interfaces and Thin Film / Thin films mehr...
ISBN:	9783540850366
EAN-Code:	9783540850366
Verlag:	Springer EN
Einband:	Gebunden
Sprache:	English
Serie:	NanoScience and Technology
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	606 gr
Seiten:	236
Illustration:	LVI, 236 p. 113 illus., 22 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.