Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Februar 2010
Genre:	Naturwissensch., Medizin, Technik
	C / Chemistry and Materials Science / Interfaces (Physical sciences) / Materials science / Materials—Surfaces / Microscopy / Microsystems and MEMS / Nanotechnology / Nanotechnology and Microengineering / Polymer chemistry / Polymer Sciences / polymers / Scientific equipment, experiments & techniques / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry / Surface and Interface and Thin Film / Surface and Interface Science, Thin Films / Surface chemistry & adsorption / Surfaces (Physics) / Surfaces and Interfaces, Thin Films / Surfaces, Interfaces and Thin Film / Thin films mehr...
ISBN:	9783642065972
EAN-Code:	9783642065972
Verlag:	Springer
Einband:	Kartoniert
Sprache:	English
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	504 gr
Seiten:	284
Illustration:	XLIV, 284 p.
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques.