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Lieferstatus:	i.d.R. innert 7-14 Tagen versandfertig
Veröffentlichung:	Dezember 2010
Genre:	Naturwissensch., Medizin, Technik
	Analytical Chemistry / C / Chemistry and Materials Science / Electronic Devices / Microscopy / Nanotechnology / Physical Chemistry / Polymer chemistry / Polymer Sciences / polymers / Scientific equipment, experiments & techniques / Solid State Physics / spectroscopy / Spectroscopy and Microscopy / Spectrum analysis, spectrochemistry, mass spectrometry
ISBN:	9783642056024
EAN-Code:	9783642056024
Verlag:	Springer Berlin Heidelberg
Einband:	Kartoniert
Sprache:	English
Serie:	NanoScience and Technology
Dimensionen:	H 235 mm / B 155 mm / D 31 mm
Gewicht:	842 gr
Seiten:	500
Zus. Info:	Paperback
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.