Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Mai 2018
Genre:	Naturwissensch., Medizin, Technik
	B / Circuits and Systems / computer hardware / Computer software—Reusability / Electronic circuits / Electronic Circuits and Devices / Electronic Circuits and Systems / Electronic devices & materials / Electronics# circuits & components / engineering / Maintenance & repairs / Performance and Reliability / Systems analysis & design
ISBN:	9789811093210
EAN-Code:	9789811093210
Verlag:	Springer Nature EN
Einband:	Kartoniert
Sprache:	English
Serie:	Computer Architecture and Design Methodologies
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	3401 gr
Seiten:	197
Illustration:	XX, 197 p. 104 illus., 72 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen
Zus. Info:	Previously published in hardcover
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.