Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Oktober 1994
Genre:	Naturwissensch., Medizin, Technik
ISBN:	9780306449017
EAN-Code:	9780306449017
Verlag:	Springer Nature Singapore
Einband:	Gebunden
Sprache:	English
Serie:	#37 - Advances in X-Ray Analysis
Dimensionen:	H 260 mm / B 183 mm / D 48 mm
Gewicht:	1644 gr
Seiten:	784
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.