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Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
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(Buch) |
Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!
| Lieferstatus: |
 Auf Bestellung (Lieferzeit unbekannt) |
| Veröffentlichung: |
Januar 2019
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| Genre: |
Naturwissensch., Medizin, Technik |
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B /
Characterization and Analytical Technique /
Characterization and Evaluation of Materials /
Materials science /
Materials—Surfaces /
Measurement /
Measurement Science and Instrumentation /
Microscopy /
Microsystems and MEMS /
Nanotechnology /
Nanotechnology and Microengineering /
Other manufacturing technologies /
Physical measurements /
Physics and Astronomy /
Scientific equipment, experiments & techniques /
Scientific standards, measurement etc /
spectroscopy /
Spectroscopy and Microscopy /
Surface chemistry & adsorption /
Surfaces and Interfaces, Thin Films /
Surfaces, Interfaces and Thin Film /
Testing of materials /
Thin films |
| ISBN: |
9783030092986 |
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EAN-Code:
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9783030092986 |
| Verlag: |
Springer Nature EN |
| Einband: |
Kartoniert |
| Sprache: |
English
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| Serie: |
#65 - Springer Series in Surface Sciences |
| Dimensionen: |
H 235 mm / B 155 mm / D 29 mm |
| Gewicht: |
831 gr |
| Seiten: |
521 |
| Illustration: |
XXIV, 521 p. 234 illus., 194 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen |
| Zus. Info: |
Previously published in hardcover |
| Bewertung: |
Titel bewerten / Meinung schreiben
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| Inhalt: |
| This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
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