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Industrial X-Ray Computed Tomography
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(Buch) |
Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!
Lieferstatus: |
Auf Bestellung (Lieferzeit unbekannt) |
Veröffentlichung: |
August 2018
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Genre: |
Naturwissensch., Medizin, Technik |
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Atomic & molecular physics /
Atomic, Molecular and Chemical Physics /
Atomic, Molecular, Optical and Plasma Physics /
Atoms /
B /
Characterization and Analytical Technique /
Characterization and Evaluation of Materials /
Chemistry and Materials Science /
Electronic devices & materials /
Electronic materials /
Machines, Tools, Processes /
Manufactures /
Manufacturing, Machines, Tools, Processes /
Materials science /
Optical and Electronic Materials /
Optical Materials /
Physics /
Production engineering |
ISBN: |
9783319866536 |
EAN-Code:
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9783319866536 |
Verlag: |
Springer Nature EN |
Einband: |
Kartoniert |
Sprache: |
English
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Dimensionen: |
H 235 mm / B 155 mm / D |
Gewicht: |
581 gr |
Seiten: |
369 |
Illustration: |
VII, 369 p. 273 illus., schwarz-weiss Illustrationen |
Zus. Info: |
Previously published in hardcover |
Bewertung: |
Titel bewerten / Meinung schreiben
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Inhalt: |
X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. Itpresents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.
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