Übersicht			Auf mobile öffnen

Lieferstatus:	Auf Bestellung (Lieferzeit unbekannt)
Veröffentlichung:	Oktober 2010
Genre:	Naturwissensch., Medizin, Technik
	C / Circuits and Systems / Computer architecture & logic design / Computer-Aided Design (CAD) / Computer-aided engineering / Computer-Aided Engineering (CAD, CAE) and Design / Electronic circuits / Electronic Circuits and Systems / engineering / Logic Design / Rechnerarchitektur und Logik-Entwurf / Verification mehr...
ISBN:	9789048181124
EAN-Code:	9789048181124
Verlag:	Springer EN
Einband:	Kartoniert
Sprache:	English
Serie:	#32 - Lecture Notes in Electrical Engineering
Dimensionen:	H 235 mm / B 155 mm / D
Gewicht:	349 gr
Seiten:	200
Illustration:	XXIV, 200 p.
Zus. Info:	EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025.
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.