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Herausgeber: 
  • Hans-Joachim Lenz
  • Wolfgang Schmid
  • Peter-Theodor Wilrich
  • Frontiers in Statistical Quality Control 10 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Veröffentlichung:  August 2012  
    Genre:  Schulbücher 
     
    C / Industrial and Production Engineering / Industrial safety / Mathematics and Statistics / Probability & statistics / quality control / Quality Control, Reliability, Safety and Risk / reliability
    ISBN:  9783790828450 
    EAN-Code: 
    9783790828450 
    Verlag:  Springer EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Serie:  #10 - Frontiers in Statistical Quality Control  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  664 gr 
    Seiten:  416 
    Illustration:  XVIII, 416 p. 128 illus., 57 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen 
    Zus. Info:  EUDR exemption - product or manufacturing materials placed on the market prior to 31.12.2025. 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    The 10th International Workshop on Intelligent Statistical Quality Control took place in Seattle, USA, Aug 18-20, 2010. It was hosted by Professor C. M. Mastrangelo, Department of Industrial and Systems Engineering, University of Washington, Seattle. The workshop was jointly organized by Professors H. J. Lenz, C. M. Mastrangelo, W. Schmid and P.T. Wilrich. The twenty-seven papers in this volume were carefully selected by the scientific program committee, reviewed by its members, revised by the authors and, finally, adapted for this volume by the editors.The book is divided into two parts: Part I "On-line Control" covers fields like control charting, monitoring and surveillance as well as acceptance sampling. Part II "Off-line Control" is devoted to experimental design, process capability analysis and data quality.The purpose of the book is on the one hand to provide insights into important new developments in the area of statistical quality control - especially surveillance and monitoring - and on the other hand to critically discuss methods used in on-line and off-line statistical quality control.
      



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