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Autor(en): 
  • Shi-Yu Huang
  • Kwang-Ting (Tim) Cheng
  • Formal Equivalence Checking and Design Debugging 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   i.d.R. innert 7-14 Tagen versandfertig
    Veröffentlichung:  Juni 1998  
    Genre:  Naturwissensch., Medizin, Technik 
     
    Algorithms / ASIC / Circuit / Computer-Aided Design (CAD) / computer-aideddesign(CAD) / Debugging / diagnosis / Elektrotechnik
    ISBN:  9780792381846 
    EAN-Code: 
    9780792381846 
    Verlag:  Springer 
    Einband:  Gebunden  
    Sprache:  English  
    Dimensionen:  H 241 mm / B 160 mm / D 19 mm 
    Gewicht:  547 gr 
    Seiten:  252 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging. The first part of the book reviews the design problems that require logic equivalence checking and describes the underlying technologies that are used to solve them. Some novel approaches to the problems of verifying design revisions after intensive sequential transformations such as retiming are described in detail. The second part of the book gives a thorough survey of previous and recent literature on design error diagnosis and design error correction. This part also provides an in-depth analysis of the algorithms used in two logic debugging software programs, ErrorTracer and AutoFix, developed by the authors. From the Foreword: `With the adoption of the static sign-off approach to verifying circuit implementations the application-specific integrated circuit (ASIC) industry will experience the first radical methodological revolution since the adoption of logic synthesis. Equivalence checking is one of the two critical elements of this methodological revolution. This book is timely for either the designer seeking to better understand the mechanics of equivalence checking or for the CAD researcher who wishes to investigate well-motivated research problems such as equivalence checking of retimed designs or error diagnosis in sequential circuits.' Kurt Keutzer, University of California, Berkeley

      



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