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Autor(en): 
  • John C. Russ
  • Computer-Assisted Microscopy: The Measurement and Analysis of Images 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

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    Lieferstatus:   i.d.R. innert 5-10 Tagen versandfertig
    Veröffentlichung:  Oktober 2011  
    Genre:  Naturwissensch., Medizin, Technik 
    ISBN:  9781461278689 
    EAN-Code: 
    9781461278689 
    Verlag:  Springer 
    Einband:  Kartoniert  
    Sprache:  English  
    Dimensionen:  H 244 mm / B 170 mm / D 26 mm 
    Gewicht:  801 gr 
    Seiten:  468 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and costs have dropped. Software to perform each of the various tasks described in this book exists now, and without doubt additional algorithms to accomplish these same things more efficiently, and to perform new kinds of image processing, feature discrimination and measurement, will continue to be developed. This is likely to be true particularly in the field of three-dimensional imaging, since new microscopy methods are beginning to be used which can produce such data. It is not the intent of this book to train programmers who will assemble their own computer systems and write their own programs. Most users require only the barest of knowledge about how to use the computer, but the greater their understanding of the various image analysis operations which are possible, their advantages and limitations, the greater the likelihood of success in their application. Likewise, the book assumes little in the way of a mathematical background, but the researcher with a secure knowledge of appropriate statistical tests will find it easier to put some of these methods into real use, and have confidence in the results, than one who has less background and experience. Supplementary texts and courses in statistics, microscopy, and specimen preparation are recommended as necessary.

      



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